Instrument reflections and scene amplitude modulation in a polychromatic microwave quadrature interferometer

Review of Scientific Instruments

Volumn 75, Issue 3, 2004, Pages 674-683

  Dobson, Chris C ^a   Jones, Jonathan E ^a   Chavers, Gregory ^a  

^a NASA MARSHALL SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC DISCHARGES (ESD); INERTIAL ELECTROSTATIC CONFINEMENT (IEC);

AMPLITUDE MODULATION; CARRIER CONCENTRATION; DATA REDUCTION; DATABASE SYSTEMS; ELECTROSTATICS; ERROR ANALYSIS; FREQUENCIES; INTERFEROMETRY; MICROWAVES; PHASE SHIFT; PLASMAS;

INTERFEROMETERS;

EID: 1842502568     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1646738     Document Type: Article

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