Ellipsometric study of superfluid onset in thin liquid 4Helium films

Journal of Low Temperature Physics

Volumn 134, Issue 1-2, 2004, Pages 303-308

  McMillan, Timothy ^a   Taborek, Peter ^a   Rutledge, J E ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ELLIPSOMETRY; MODULATION; SENSITIVITY ANALYSIS; SUBSTRATES; TEMPERATURE DISTRIBUTION; THIN FILMS;

ELLIPSOMETERS; QUARTZ CRYSTAL MICROBALANCE (QCM);

HELIUM;

ELLIPSOMETRY; FILM THICKNESS; LIQUID HELIUM; SUPERFLUID;

EID: 1842486767     PISSN: 00222291     EISSN: None     Source Type: Journal    
DOI: 10.1023/b:jolt.0000012570.57934.13     Document Type: Article

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