Multi-reflection method and grazing incidence geometry used for stress measurement by X-ray diffraction

Surface and Coatings Technology

Volumn 182, Issue 1, 2004, Pages 43-54

  Baczmanski, A ^a   Braham, C ^b   Seiler, W ^b   Shiraki, N ^c  

^a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^b CNRS   (France)

^c TOKYO CITY UNIVERSITY   (Japan)

Author keywords

Grazing incidence geometry; Residual stresses; Surface layers; X ray diffraction

Indexed keywords

CRYSTALLOGRAPHY; FORMABILITY; STRAIN; STRESS ANALYSIS; X RAY ANALYSIS; X RAY DIFFRACTION;

GRAZING INCIDENCE GEOMETRY; MULTI-REFLECTION METHOD;

POLYCRYSTALLINE MATERIALS;

COATING;

EID: 1842481004     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2003.07.005     Document Type: Article

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