Spectral Drop Analysis and 3-D Liquid Drop Fingerprint

Instrumentation Science and Technology

Volumn 32, Issue 2, 2004, Pages 153-165

  Song, Qing ^a   Zhang, Guoxiong ^a   Qiu, Zurong ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

3 D Liquid drop fingerprint; Absorption; Spectral drop analysis; Spectrum; Transmission optical path

Indexed keywords

CHARGE COUPLED DEVICES; CHEMICAL ANALYSIS; ELECTROMAGNETIC WAVES; FAST FOURIER TRANSFORMS; FIBER OPTIC CHEMICAL SENSORS; FREQUENCY DOMAIN ANALYSIS; IMAGE PROCESSING; MONOCHROMATORS;

3-D LIQUID DROP FINGERPRINT; SPECTRAL DROP ANALYSIS; TRANSMISSION OPTICAL PATH;

SPECTRUM ANALYSIS;

EID: 1842480238     PISSN: 10739149     EISSN: None     Source Type: Journal    
DOI: 10.1081/CI-120028768     Document Type: Review

References (8)

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2. Wang, C.H.; Augousti, A.T.; Mason, J.; McMillan, N.D. The capacitive drop tensiometer - a novel multianalysing technique for measuring the properties of liquids. Meas. Sci. Technol. 1999, 10 (1), 19-24.
3. Song, Q.; Zhang, G.X.; Qui, Z.R. Drop growth monitoring and drop volume measurement based on image drop analysis with CCD. Instrum. Sci. Technol. 2003, 31 (1), 1-13.
4. Song, Q.; Zhang, G.X.; Qui, Z.R; Zhang, A.P; Shi, Q.W. The liquid signature analyzer based on fiber-capacitive drop analysis. Instrum. Sci. Technol. 2004, 32 (1), 43-59.
5. Song, Q.; Zhang, G.X.; Qui, Z.R; Shi, Q.W. Design of program-controlled micro-flow feeding system for applications in drop analysis. Chinese J. Sci. Instrum. 2003, in press.
6. Song, Q.; Zhang, G.X.; Qui, Z.R. Study on the photoelectric liquid drop sensor for application in drop analysis. J. Optoelectr. Laser 2003, 14 (12), 1272-1276 (in Chinese).
7. Song, Q.; Zhang, A.P.; Zhang, G.X.; Qiu, Z.R. Design of signal processing circuit for capacitive drop sensor. Proc. 2nd Int. Symp. on Instrum. Sci. Technol. (ISIST) August 18-22, 2002; Jinan, China, 3, 652-658.
8. Song, Q.; Zhang, G.X.; Zhang, A.P. A study on the signal processing for the capacitive drop sensor based on frequency modulation. Electron. Meas. Technol. 2003 (2), 5-6.