In-plane structure analysis of BEDT-TTF thin films by X-Ray diffraction

Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals

Volumn 377, Issue , 2002, Pages 381-384

  Yoshimoto, Noriyuki ^a   Sato, Takeshi ^a   Ogawa, Kaoru ^b   Omote, Kazuhiko ^c   Saito, Yoshio ^d   Yoshizawa, Masahito ^a  

^a IWATE UNIVERSITY   (Japan)

^b Iwate Industrial Promotion Center   (Japan)

^c RIGAKU CORPORATION   (Japan)

^d KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

BEDT TTF; In plane orientation; Thin film; X ray diffraction

Indexed keywords

MOLECULAR DYNAMICS; MULTILAYERS; SUBSTRATES; SUPERCONDUCTING MATERIALS; X RAY DIFFRACTION ANALYSIS;

BEDT-TTF; EPITAXIAL RELATIONSHIP; IN-PLANE ORIENTATION;

THIN FILMS;

EID: 1842476101     PISSN: 1058725X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10587250290089338     Document Type: Conference Paper

References (5)

1. K. Omote, J. Harada, Advances in X-Ray Analysis, 43, 192 (2000).
2. E. B. Yagubskii, I.F.Shchegolev, V. N. Laukhin, P. A. Kononovich, M. V. Karatsovnik, A. V. Zvarykina and L. I. Buravov, JETP Lett., 39, 12 (1984).
3. H. Urayama, H. Yamochi, G. Saito, K. Nozawa, T. Sugano, M. Kinoshita, S. Saito, K. Oshima, A. Kawamoto and J. Tanaka, Chem. Lett, 55(1988).
4. H. Kobayashi, A. Kobayashi, Y. Sasaki, G. Saito and H. Inokuchi, Bull. Chem. Soc. Jpn., 59, 301 (1986).
5. N.shimoto, H. Maehara, Y. Ueda, J. Ni, K. Omote and M. Yoshizawa, Mol. Cryst. Liq. Cryst., 316, 129 (1998).