Infrared Absorption Enhancement of C60 by Overlaying Thin Silver Island Films

Applied Spectroscopy

Volumn 58, Issue 3, 2004, Pages 299-303

  Wadayama, T ^a   Aoshima, K ^a   Kawano, S ^a   Hatta, A ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

AFM; Atomic force microscopy; C60; Silver; Surface enhanced infrared absorption

Indexed keywords

ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; INFRARED SPECTROSCOPY; METALLIC FILMS; MONOLAYERS; RAMAN SCATTERING; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SILVER; SURFACE STRUCTURE; THICKNESS MEASUREMENT; THIN FILMS;

AFM; C60; SURFACE-ENHANCED INFRARED SPECTROSCOPY;

CARBON;

EID: 1842431400     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/000370204322886645     Document Type: Article

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