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Volumn 45, Issue 2, 2004, Pages 214-217
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Automated batch characterization of ICF shells with vision-enabled optical microscope system
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Author keywords
[No Author keywords available]
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Indexed keywords
CALCULATIONS;
EDGE DETECTION;
GLASS;
HIGH TEMPERATURE PROPERTIES;
IMAGE ANALYSIS;
INTERFEROMETRY;
OPTICAL MICROSCOPY;
THICKNESS MEASUREMENT;
AUTOMATED BATCH CHARACTERIZATION;
INERTIAL FUSION ENERGY;
NANOSURFACE FINISH;
WHITE-LIGHT INTERFEROMETRY;
INERTIAL CONFINEMENT FUSION;
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EID: 1842430183
PISSN: 15361055
EISSN: None
Source Type: Journal
DOI: 10.13182/FST04-A453 Document Type: Article |
Times cited : (18)
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References (5)
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