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Volumn 18, Issue 6, 2004, Pages 601-608
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Characterization of a model Phillips catalyst by mass spectrometry
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CATALYSTS;
CHROMIUM COMPOUNDS;
DESORPTION;
ETHYLENE;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
LASER ABLATION;
MASS SPECTROMETRY;
POLYMERIZATION;
SILICON WAFERS;
CHROMIUM CONCENTRATION;
COMPLEMENTARY TECHNIQUES;
ETHYLENE POLYMERIZATION;
FOURIER TRANSFORM MASS SPECTROMETRY;
LASER DESORPTION/IONIZATION MASS SPECTROMETRIES;
LASERS ABLATIONS;
MODEL CATALYSTS;
MOLECULAR SPECIES;
PHILLIPS CATALYSTS;
SILICON WAFER SURFACE;
CHEMICAL ACTIVATION;
CHROMIC OXIDE;
CHROMIUM;
ETHYLENE;
OXIDE;
SILICON;
UNCLASSIFIED DRUG;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CATALYST;
CONCENTRATION (PARAMETERS);
DEGRADATION;
FOURIER TRANSFORM MASS SPECTROMETRY;
HIGH TEMPERATURE;
INFRARED SPECTROSCOPY;
LASER ABLATION FOURIER TRANSFORM MASS SPECTROMETRY;
LASER DESORPTION IONIZATION MASS SPECTROMETRY;
MASS SPECTROMETRY;
MATERIAL COATING;
MORPHOLOGY;
OXIDATION;
PHILLIPS CATALYST;
POLYMERIZATION;
SPIN COATING;
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EID: 1842428664
PISSN: 09514198
EISSN: None
Source Type: Journal
DOI: 10.1002/rcm.1375 Document Type: Article |
Times cited : (7)
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References (45)
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