Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber

Conference on Optical Fiber Communication, Technical Digest Series

Volumn 54, Issue 2, 2001, Pages

  Park, Y ^a   Ahn, T J ^a   Kim, Y H ^a   Han, W T ^a   Paek, U C ^a   Kim, D Y ^a  

^a Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ERBIUM; OPTICAL FIBERS; OPTICAL KERR EFFECT; OPTICAL RESOLVING POWER; PHOTOELASTICITY; SEMICONDUCTING BORON; SEMICONDUCTING GERMANIUM; SEMICONDUCTOR DOPING;

BORON-GERMANIUM DOPED FIBER; ERBIUM-ALUMINUM DOPED FIBER; PHOTOELASTIC EFFECT; RESIDUAL STRESS;

OPTICAL VARIABLES MEASUREMENT;

EID: 18344418510     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)