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Volumn 357-358, Issue , 1996, Pages 476-480

Structural study of reconstructions at Si(110)-Pb surfaces

Author keywords

Epitaxy; Lead; Low index single crystal surfaces; Reflection high energy electron diffraction (RHEED); Silicon; Surface relaxation and reconstruction

Indexed keywords

DEPOSITION; EPITAXIAL GROWTH; LEAD; MONOLAYERS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; RELAXATION PROCESSES; SEMICONDUCTING SILICON;

EID: 18344417544     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)06205-X     Document Type: Article
Times cited : (5)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.