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Volumn 357-358, Issue , 1996, Pages 476-480
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Structural study of reconstructions at Si(110)-Pb surfaces
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Author keywords
Epitaxy; Lead; Low index single crystal surfaces; Reflection high energy electron diffraction (RHEED); Silicon; Surface relaxation and reconstruction
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Indexed keywords
DEPOSITION;
EPITAXIAL GROWTH;
LEAD;
MONOLAYERS;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
RELAXATION PROCESSES;
SEMICONDUCTING SILICON;
ATOMIC CHAINS;
LOW INDEX SINGLE CRYSTAL SURFACES;
SUPERSTRUCTURE;
SURFACE RECONSTRUCTION;
SURFACE STRUCTURE;
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EID: 18344417544
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(96)06205-X Document Type: Article |
Times cited : (5)
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References (8)
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