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Volumn 398-399, Issue , 2001, Pages 485-489

Characterization and light-emitting properties of Au/SiOx/p-Si and Au/Ni-implanted-SiOx/p-Si structures

Author keywords

Carrier transport; Defects; Electroluminescence; Implantation; Ni; SiOx

Indexed keywords

ANNEALING; DEPOSITION; ELECTROLUMINESCENCE; ION IMPLANTATION; MIS DEVICES; PHOTOLUMINESCENCE; SUBSTRATES;

EID: 18344405357     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01392-X     Document Type: Article
Times cited : (4)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.