Structural properties of sputtered ZnO: Au films

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 82, Issue 1, 2002, Pages 193-204

  Goldenblum, A ^a   Teodorescu, V ^a   Wagner, F E ^b   Manaila, R ^a   Filoti, G ^a   Deville, J R ^c   Pantelica, D ^d   Negoita, F ^d   Belu Marian, A ^a   Scantee, N ^d  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

^d HORIA HULUBEI NATIONAL INSTITUTE OF PHYSICS AND NUCLEAR ENGINEERING   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; GOLD; MAGNETRON SPUTTERING; MOSSBAUER SPECTROSCOPY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPUTTER DEPOSITION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ELASTIC RECOIL DETECTION ANALYSIS; SELECTED AREA ELECTRON DIFFRACTION; STRUCTURAL PROPERTIES;

ZINC OXIDE;

EID: 18344371430     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610208240004     Document Type: Article

References (13)

1. Audouard, A., Kazoun, A., Cherradi, N., Marchal, G., and Gerl, M., 1989, Phil. Mag. B, 59, 207.
2. Ellmer, K., 2000, J. Phys. D, 33, R17.
3. Jin, Z. C., Hamberg, I., and Granqvist, C. G., 1988, J. appl. Phys., 64, 5117.
4. Mangin, Ph., Marchal, G., Mouray, C, and Janot, C., 1980, Phys. Rev. B, 21, 3047.
5. Morigaki, K., 1980, Phil. Mag. B, 42, 979.
6. Mott, N. F., and Davis, E. A., 1979, Electronic Processes in Non-crystalline Materials (Oxford: Clarendon), chapter 4.
7. Neumann, G., 1981, Curr. Topics Mater. Sci., 7, 153.
8. Pantelica, D., Negoita, F., and Borcan, C., 2002 (to be published).
9. Paraguay, F., Estrada, W., Acosta, D. R., and Miky Yoshida, 1998a, Proceedings of the Fourteenth International Conference on Electron Microscopy, Vol. 2, Cancun, Mexico, 1998, (Bristol: Institute of Physics) p. 343.
10. Paraguay, F., Morales, J., Estrada, W., and Miky Yoshida, 1998b, Proceedings of the Fourteenth International Conference on Electron Microscopy, Vol. 2, Cancun Mexico, (Bristol: Institute of Physics) p. 345.
11. Rosenbaum, R, Heines, A., Palevsky, A., Karpovsky, A., Gladkikh, A., Pilosof, M., Daneshvar, A. J., Graham, M. R., Wright, T., Nicholls, J. T., Adkins, C. J., Witcomb, M., Prozesky, V., Przybylowicz, W., and Pretorius, R., 1997a, J. Phys.: condens. Matter, 9, 5395.
12. Rosenbaum, R., Lien Nguyen, V., Graham, M. R., and Witcomb, M., 1997b, J. Phys.: condens. Matter, 9, 6247.
13. Shoshany, J., Goldner, V., Rosenbaum, R., Witcomb, M., McLachlan, D. S., Palevsky, A., Karpovsky, M., Gladkikh, A., and Lereah, Y., 1996, J. Phys.: condens. Matter, 8, 1729.