Investigations of atomic diffusion at CIGSSe/ZnSe interfaces with heavy ion elastic recoil detection analysis (HI-ERDA)

Thin Solid Films

Volumn 403-404, Issue , 2002, Pages 432-437

  Lindner, S ^a   Bohne, W ^a   Jager Waldau A ^b   Lux Steiner, M Ch ^a   Rohrich J ^a   Vogl, G ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b JOINT RESEARCH CENTRE   (Italy)

Author keywords

CIGSSe; Elastic recoil detection analysis (ERDA); Indium diffusion; Roughness modelling; ZnSe

Indexed keywords

ANNEALING; ARGON; ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; COPPER COMPOUNDS; HEAVY IONS; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); MORPHOLOGY; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS; SOLAR CELLS; SPECTRUM ANALYSIS; SURFACE ROUGHNESS;

HEAVY ION ELASTIC RECOIL DETECTION ANALYSIS (HI-ERDA);

THIN FILM DEVICES;

EID: 18244427318     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01540-1     Document Type: Conference Paper

References (7)

1. The stopping and range of ions in solids