Ionization measurement at very low temperature for nuclear and electron recoils discrimination by ionization-heat simultaneous measurement for dark matter research

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 442, Issue 1, 2000, Pages 267-274

  Navick, X F ^a   L'Hote D ^a   Tourbot, R ^a  

^a DIF   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC SPACE CHARGE; GAMMA RAYS; INFRARED RADIATION; IONIZATION; LOW TEMPERATURE OPERATIONS; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; THERMAL VARIABLES MEASUREMENT; X RAYS;

CARRIER TRAPPING; DARK MATTER RESEARCH; ELECTRON RECOILS; ENERGY RESOLUTION; IMPURITIES IONIZATION; IONIZATION HEAT DETECTORS; IONIZATION MEASUREMENT; NUCLEAR RECOILS;

RADIATION DETECTORS;

EID: 18244424752     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)01232-2     Document Type: Article

References (8)

1. T. Shutt et al., Phys. Rev. Lett. 24 (1992) 3531.
2. M. Bravin et al., The CRESST Dark Matter Search, to appear in Astroparticle Physics, hep-ex/9904005, 6 April 1999.
3. X.F. Navick et al., Nucl. Instr. and Meth. A 370 (1996) 213.
4. M. Chapellier et al., LT22 Proceedings Workshop on Low Temperature Physics, Helsinki (Finland) 1999, in press.
5. D. L'Hôte et al., Nucl. Instr. and Meth. A 370 (1996) 193.
6. X.F. Navick et al., Proceedings of the LTD7, Munich, 1997, p. 244.
7. X.F. Navick, Thesis at the Paris 7 University, France, 1997.
8. V.N. Abakumov et al., Nonradiative recombinaison in semiconductors, Coll. Modern Problems in Condensed Matter Sciences, Vol. 33, (1991) North-Holland, Amsterdam.