Implementation of frequency-modulated thermal wave imaging for non-destructive sub-surface defect detection

Insight: Non-Destructive Testing and Condition Monitoring

Volumn 47, Issue 4, 2005, Pages 206-208

  Mulaveesala, Ravibabu ^a   Tuli, Suneet ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; FREQUENCY MODULATION; HEATING; IMAGING TECHNIQUES; THERMAL DIFFUSION; THERMOGRAPHY (IMAGING);

DEFECT DETECTION; PULSE PHASE THERMOGRAPHY; THERMAL NONDESTRUCTIVE TESTING; THERMAL WAVE IMAGING;

NONDESTRUCTIVE EXAMINATION;

EID: 18244406797     PISSN: 13542575     EISSN: None     Source Type: Journal    
DOI: 10.1784/insi.47.4.206.63156     Document Type: Article

References (8)

1. Maldague X P V: Theory and Practice of Infrared Thermography for Non-destructive Testing, John Wiley & Sons Inc., 2001.
2. Datong Wu, Gerd Busse: Lock-in thermography for nondestructive evaluation of materials. Rev. Gen. Therm, 1998, pp 693-703.
3. Zweschper Th, Dillenz A, Riegert G, Scherling D and Busse G: Ultrasound excited thermography using frequency modulated elastic waves. Insight, Vol 145 No 3, March 2003, pp 1-5.
4. Tuli S, Mulaveesala R: Frequency-Modulated wave Thermography for Non- Destructive Testing. Proceedings, QIRT 2004, 2004, pp H.6.1-6.6.
5. Donald R Wehner: High Resolution Radar, Artech House, Inc., 1994.
6. Tuli S, Mulaveesala R: Defect detection by pulse compression in frequency modulated thermal wave imaging QIRT Journal. (communicated). Oct. 2004.
7. Rakotoniaina J. P, Breitenstein O, Langenkamp M: Localization of weak heat sources in electronic devices using highly sensitive Lock-in thermography, Material science and engineering, B91-92, 2002. pp 481-485.
8. Maldague X P V, Marinetti S: Pulse Phase Infrared Thermography, J. Appl. Phys. 79-5, 1996, pp 2694-2698.