Electrostatic proximity force, toner adhesion, and atomic force microscopy of insulating particles

Journal of Electrostatics

Volumn 63, Issue 6-10, 2005, Pages 699-704

  Schein, L B ^a,b   Stanley Czarnecki, W ^a,c,d  

^a Aetas Technology Inc   (United States)

^b Torrey Pines Research ^*  (United States)

^c Torrey Pines Research   (United States)

^d IBM   (United States)

Author keywords

Adhesion; Atomic force microscopy; Electrostatic adhesion; Proximity force; Toner adhesion

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; CHARGED PARTICLES; ELECTRIC CONDUCTIVITY; ELECTROSTATICS;

CONDUCTIVE PLANE; ELECTROSTATIC ADHESION; ELECTROSTATIC PROXIMITY FORCE; TONER ADHESION;

INSULATING MATERIALS;

ELECTROSTATICS;

EID: 18244371418     PISSN: 03043886     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elstat.2005.03.083     Document Type: Article

References (10)

1. W. Stanley Czarnecki L.B. Schein J. Electrostat. 61 2004 107
2. D.A. Hays J. Adhes. 51 1995 41
3. B. Gady D.J. Quesnal D.S. Rimai S. Leone P. Alexandrovich J. Imag. Sci. Technol. 43 1999 288-294
4. B. Gady D. Schleef R. Reifenberger D. Rimai L.P. DeMejo Phy. Rev. B 53 1996 8065
5. B. Gady R. Reifenberger D. Rimai L.P. DeMejo Langmuir 13 1997 2533
6. N.A. Burnham R.J. Colton H.M. Pollock Phys. Rev. Lett. 69 1992 144
7. W.R. Harper Contact and Frictional Electrification 1967 Clarendon Press Oxford p. 10
8. L.B. Schein W. Stanley Czarnecki J. Imag. Sci. Technol. 48 2004 412
9. L.B. Schein W. Stanley Czarnecki B. Christensen T. Mu G. Galliford J. Imag. Sci. Technol. 48 2004 417
10. W. Stanley Czarnecki L.B. Schein Phys. Lett. A 339 2005 145-151