Surface-Roughness Wakefield Measurements at Brookhaven Accelerator Test Facility

Physical Review Letters

Volumn 89, Issue 17, 2002, Pages

  Zhou, F ^a,b   Wu, J H ^a,c   Babzien, M ^a   Ben Zvi, I ^a   Malone, R ^a   Murphy, J B ^a   Wang, X J ^a   Woodle, M H ^a   Yakimenko, V ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c STONY BROOK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; COLLIDING BEAM ACCELERATORS; ELECTRON BEAMS; FREE ELECTRON LASERS; LIGHT VELOCITY; PARTICLE ACCELERATORS; SPECTROMETERS; WAKES;

INNER DIAMETER; SURFACE-ROUGHNESS WAKEFIELD MEASUREMENTS; X-RAY FREE ELECTRON LASERS;

SURFACE ROUGHNESS;

EID: 18144446140     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.89.174801     Document Type: Article

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