Absolute intensities in the ν7 band of ethylene: Tunable laser measurements used to calibrate FTS broadband spectra

Journal of Quantitative Spectroscopy and Radiative Transfer

Volumn 68, Issue 4, 2001, Pages 467-472

  Blass, William E ^a   Jennings, Larry ^a   Ewing, Alan C ^a   Daunt, Stephen J ^a   Weber, Mark C ^a   Senesac, Larry ^a   Hager, Stewart ^a   Hillman, John J ^b   Reuter, Dennis C ^b   Sirota, J Marcos ^b  

^a UNIVERSITY OF TENNESSEE   (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; ETHYLENE; IMAGE ANALYSIS; IMAGE QUALITY; LASER APPLICATIONS; LASER TUNING; LEAST SQUARES APPROXIMATIONS;

LEAST-SQUARES FITTING;

SPECTROSCOPIC ANALYSIS;

EID: 18144445661     PISSN: 00224073     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-4073(00)00050-9     Document Type: Article

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