In situ XAFS investigation on the oxidation of Cu foils at T> 770 K

Journal De Physique. IV : JP

Volumn 7, Issue 2 Part 2, 1997, Pages

  Hilbrandt, N ^a   Frahm, R ^b   Martin, M ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; COPPER; COPPER OXIDES; OSCILLATIONS; OXIDATION; REACTION KINETICS; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

QUICK EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; SOLID STATE REACTION; X RAY ABSORPTION NEAR EDGE STRUCTURE (XANES) SPECTROSCOPY;

METAL FOIL;

EID: 18144436883     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:1997220     Document Type: Article

References (10)

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7. Ressler Th., PhD Thesis, University of Hamburg (1995)
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9. personal communication, K. Riest, University of Hannover
10. N. Hilbrandt, M. Martin, Solid State Ionics (in press)