Critical thickness for two-dimensional tearing instability

Geophysical Research Letters

Volumn 31, Issue 3, 2004, Pages

  Tanaka, K G ^a   Shinohara, I ^b   Fujimoto, M ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; STABILITY; THICKNESS MEASUREMENT;

CURRENT SHEETS; PARTICLE SIMULATION; TEARING MODE SATURATION;

GEOPHYSICS;

INSTABILITY;

EID: 18144434297     PISSN: 00948276     EISSN: None     Source Type: Journal    
DOI: 10.1029/2003GL018955     Document Type: Article

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