X-ray diffraction and FTIR spectroscopy of heat treated R2O3:3Ga2O3:4B2O3 systems

Journal of Crystal Growth

Volumn 237-239, Issue 1-4, 2002, Pages 874-878

  Beregi, E ^a   Watterich, A ^a   Madarasz J ^b   Toth M ^a   Polgar K ^a  

^a INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

^b BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

Author keywords

A1. X ray diffraction; B1. Borates; B1. Rare earth compounds; B2. Non linear optic materials

Indexed keywords

CRYSTAL GROWTH; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HEAT TREATMENT; INFRARED SPECTROSCOPY; NONLINEAR OPTICS; OPTICAL MATERIALS; RARE EARTH COMPOUNDS; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

NON-LINEAR OPTICAL MATERIALS;

TERNARY SYSTEMS;

EID: 18144433148     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)02042-5     Document Type: Article

References (7)