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Volumn 37, Issue 2, 2005, Pages 361-369
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State of the art unit root tests and purchasing power parity
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Author keywords
Lag selection; Purchasing power parity; Unit root tests
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Indexed keywords
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EID: 18144430623
PISSN: 00222879
EISSN: None
Source Type: Journal
DOI: 10.1353/mcb.2005.0022 Document Type: Article |
Times cited : (61)
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References (7)
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