Clutter invariant ATR

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 27, Issue 5, 2005, Pages 817-821

  Bitouk, Dmitri ^a   Miller Sr , Michael I ^a   Younes, Laurent ^a  

^a Johns Hopkins University   (United States)

Author keywords

Automated Target Recognition (ATR); Deformable templates; Riemannian metrics

Indexed keywords

BOUNDARY CONDITIONS; CONVERGENCE OF NUMERICAL METHODS; EIGENVALUES AND EIGENFUNCTIONS; INTERPOLATION; ITERATIVE METHODS; MARKOV PROCESSES; MATHEMATICAL MODELS; MATHEMATICAL TRANSFORMATIONS; OBJECT RECOGNITION; OPTIMIZATION; THEOREM PROVING;

CLUTTER INVARIANT; DEFORMABLE TEMPLATES; RIEMANNIAN METRICS;

AUTOMATIC TARGET RECOGNITION;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; CLUSTER ANALYSIS; COMPARATIVE STUDY; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; EVALUATION; IMAGE ENHANCEMENT; IMAGE SUBTRACTION; INFORMATION RETRIEVAL; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; STATISTICAL MODEL; STATISTICS; THREE DIMENSIONAL IMAGING; VALIDATION STUDY;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; CLUSTER ANALYSIS; COMPUTER SIMULATION; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; INFORMATION STORAGE AND RETRIEVAL; MODELS, STATISTICAL; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; STOCHASTIC PROCESSES; SUBTRACTION TECHNIQUE;

EID: 18144429440     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2005.97     Document Type: Article

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