Test in the era of "what you see is not what you get"

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 12-

  Koenemann, Bernd ^a  

^a CADENCE DESIGN SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN COMPLEXITIES; DESIGN-PROCESS CHARACTERIZATION; PARAMETRIC PERFORMANCE; STRUCTURAL TEST METHODS;

CHARACTERIZATION; COMPUTATIONAL COMPLEXITY; DEFECTS; MATERIALS TESTING; PROCESS CONTROL; STRUCTURAL ANALYSIS;

STRUCTURAL DESIGN;

EID: 18144425576     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)