-
1
-
-
0036505718
-
On the mode II popcorn effect in thin packages
-
P. Alpern, R. Dudek, R. Schmidt, V. Wicher, and R. Tilgner On the mode II popcorn effect in thin packages IEEE Transactions on Components and Packaging Technologies 25 1 2002 56 65
-
(2002)
IEEE Transactions on Components and Packaging Technologies
, vol.25
, Issue.1
, pp. 56-65
-
-
Alpern, P.1
Dudek, R.2
Schmidt, R.3
Wicher, V.4
Tilgner, R.5
-
2
-
-
0141854001
-
Vapor pressure assisted void growth and cracking of polymeric films and interfaces
-
L. Cheng, and T.F. Guo Vapor pressure assisted void growth and cracking of polymeric films and interfaces Interface Science 11 2003 277 290
-
(2003)
Interface Science
, vol.11
, pp. 277-290
-
-
Cheng, L.1
Guo, T.F.2
-
3
-
-
2442547311
-
Vapor pressure and residual stress effects on the toughness of polymeric adhesive joints
-
H.B. Chew, T.F. Guo, and L. Cheng Vapor pressure and residual stress effects on the toughness of polymeric adhesive joints Engineering Fracture Mechanics 71 2004 2435 2448
-
(2004)
Engineering Fracture Mechanics
, vol.71
, pp. 2435-2448
-
-
Chew, H.B.1
Guo, T.F.2
Cheng, L.3
-
4
-
-
3142750608
-
Vapor pressure assisted crack growth at interfaces under mixed mode loading
-
C.W. Chong, T.F. Guo, and L. Cheng Vapor pressure assisted crack growth at interfaces under mixed mode loading Computational Materials Science 30 2004 425 432
-
(2004)
Computational Materials Science
, vol.30
, pp. 425-432
-
-
Chong, C.W.1
Guo, T.F.2
Cheng, L.3
-
5
-
-
0029168229
-
Finite element simulations of ductile rupture in a constrained metal foil
-
R.S. Chowdhury, and R. Narasimhan Finite element simulations of ductile rupture in a constrained metal foil Material Science and Engineering A 191 1995 27 37
-
(1995)
Material Science and Engineering A
, vol.191
, pp. 27-37
-
-
Chowdhury, R.S.1
Narasimhan, R.2
-
6
-
-
0033874963
-
A finite element analysis of stationary crack tip fields in a pressure sensitive constrained ductile layer
-
R.S. Chowdhury, and R. Narasimhan A finite element analysis of stationary crack tip fields in a pressure sensitive constrained ductile layer International Journal of Solids and Structures 37 2000 3079 3100
-
(2000)
International Journal of Solids and Structures
, vol.37
, pp. 3079-3100
-
-
Chowdhury, R.S.1
Narasimhan, R.2
-
7
-
-
0033703932
-
A finite element analysis of quasistatic crack growth in a pressure sensitive constrained ductile layer
-
R.S. Chowdhury, and R. Narasimhan A finite element analysis of quasistatic crack growth in a pressure sensitive constrained ductile layer Engineering Fracture Mechanics 66 2000 551 571
-
(2000)
Engineering Fracture Mechanics
, vol.66
, pp. 551-571
-
-
Chowdhury, R.S.1
Narasimhan, R.2
-
8
-
-
0026085946
-
Elastic-plastic analysis of cracks in pressure sensitive materials
-
P. Dong, and J. Pan Elastic-plastic analysis of cracks in pressure sensitive materials International Journal of Solids and Structures 28 1991 1113 1127
-
(1991)
International Journal of Solids and Structures
, vol.28
, pp. 1113-1127
-
-
Dong, P.1
Pan, J.2
-
9
-
-
0029346335
-
The thermomechanical integrity of thin films and multilayers
-
A.G. Evans, and J.W. Hutchinson The thermomechanical integrity of thin films and multilayers Acta Metallurgica et Materialia 43 7 1995 2507 2530
-
(1995)
Acta Metallurgica Et Materialia
, vol.43
, Issue.7
, pp. 2507-2530
-
-
Evans, A.G.1
Hutchinson, J.W.2
-
10
-
-
0032273429
-
Cell model for non-linear fracture analysis-I. Micromechanics calibration
-
J. Faleskog, X. Gao, and C.F. Shih Cell model for non-linear fracture analysis-I. Micromechanics calibration International Journal of Fracture 89 1998 355 373
-
(1998)
International Journal of Fracture
, vol.89
, pp. 355-373
-
-
Faleskog, J.1
Gao, X.2
Shih, C.F.3
-
11
-
-
0022183127
-
Moisture resistance degradation of plastic LSIs by reflow soldering
-
Fukuzawa, I., Ishiguro, S., Nanbu, S., 1985. Moisture resistance degradation of plastic LSIs by reflow soldering. In: IEEE/IRPS International Reliability of Physics Symposium, pp. 192-197
-
(1985)
IEEE/IRPS International Reliability of Physics Symposium
, pp. 192-197
-
-
Fukuzawa, I.1
Ishiguro, S.2
Nanbu, S.3
-
14
-
-
0004294403
-
WARP3D: 3-D dynamic nonlinear fracture analysis of solids using parallel computers and workstations
-
Civil Engineering Studies UILU-ENG-95-2012, University of Illinois at Urbrana-Champaign
-
Gullerud, A.S., Koppenhoefer, K.C., Ruggieri, C., Dodds, Jr. R.H., 2002. WARP3D: 3-D dynamic nonlinear fracture analysis of solids using parallel computers and workstations. Civil Engineering Studies, Structural Research Series No. 607, UILU-ENG-95-2012, University of Illinois at Urbrana-Champaign
-
(2002)
Structural Research Series No. 607
, vol.607
-
-
Gullerud, A.S.1
Koppenhoefer, K.C.2
Ruggieri, C.3
Dodds Jr., R.H.4
-
15
-
-
0035893384
-
Thermal and vapor pressure effects on cavitation and void growth
-
T.F. Guo, and L. Cheng Thermal and vapor pressure effects on cavitation and void growth Journal of Materials Science 36 24 2001 5871 5879
-
(2001)
Journal of Materials Science
, vol.36
, Issue.24
, pp. 5871-5879
-
-
Guo, T.F.1
Cheng, L.2
-
16
-
-
0036681578
-
Modeling vapor pressure effects on void rupture and crack growth resistance
-
T.F. Guo, and L. Cheng Modeling vapor pressure effects on void rupture and crack growth resistance Acta Materialia 50 13 2002 3487 3500
-
(2002)
Acta Materialia
, vol.50
, Issue.13
, pp. 3487-3500
-
-
Guo, T.F.1
Cheng, L.2
-
17
-
-
0037409454
-
Vapor pressure and void size effects on failure of a constrained ductile film
-
T.F. Guo, and L. Cheng Vapor pressure and void size effects on failure of a constrained ductile film Journal of the Mechanics and Physics of Solids 51 2003 993 1014
-
(2003)
Journal of the Mechanics and Physics of Solids
, vol.51
, pp. 993-1014
-
-
Guo, T.F.1
Cheng, L.2
-
18
-
-
0017417249
-
Continuum theory of ductile rupture by void nucleation and growth: Part I-Yield criteria and flow rules for porous ductile media
-
A.L. Gurson Continuum theory of ductile rupture by void nucleation and growth: Part I-Yield criteria and flow rules for porous ductile media Journal of Engineering Materials and Technology 99 1977 2 15
-
(1977)
Journal of Engineering Materials and Technology
, vol.99
, pp. 2-15
-
-
Gurson, A.L.1
-
19
-
-
0030392198
-
A model study of thermal stress-induced voiding in electronic packages
-
Y. Huang, K.X. Hu, C.P. Yeh, N.Y. Li, and K.C. Hwang A model study of thermal stress-induced voiding in electronic packages Journal of Electronic Packaging 118 1996 229 234
-
(1996)
Journal of Electronic Packaging
, vol.118
, pp. 229-234
-
-
Huang, Y.1
Hu, K.X.2
Yeh, C.P.3
Li, N.Y.4
Hwang, K.C.5
-
20
-
-
0025403309
-
Plane-strain crack-tip fields for pressure-sensitive dilatant materials
-
F.Z. Li, and J. Pan Plane-strain crack-tip fields for pressure-sensitive dilatant materials Journal of Applied Mechanics 57 1990 40 49
-
(1990)
Journal of Applied Mechanics
, vol.57
, pp. 40-49
-
-
Li, F.Z.1
Pan, J.2
-
21
-
-
0025623828
-
Plane-stress crack-tip fields for pressure-sensitive dilatant materials
-
F.Z. Li, and J. Pan Plane-stress crack-tip fields for pressure-sensitive dilatant materials Engineering Fracture Mechanics 35 1990 1105 1116
-
(1990)
Engineering Fracture Mechanics
, vol.35
, pp. 1105-1116
-
-
Li, F.Z.1
Pan, J.2
-
22
-
-
0029373480
-
Behavior of delaminated plastic IC packages subjected to encapsulation cooling, moisture absorption, and wave soldering
-
S. Liu, and Y. Mei Behavior of delaminated plastic IC packages subjected to encapsulation cooling, moisture absorption, and wave soldering IEEE Transactions on Components Packaging and Manufacturing Technology Part A 18 3 1995 634 645
-
(1995)
IEEE Transactions on Components Packaging and Manufacturing Technology Part A
, vol.18
, Issue.3
, pp. 634-645
-
-
Liu, S.1
Mei, Y.2
-
23
-
-
0023594596
-
A general treatment of crack tip contour integrals
-
B. Moran, and C.F. Shih A general treatment of crack tip contour integrals International Journal of Fracture 35 1987 363 371
-
(1987)
International Journal of Fracture
, vol.35
, pp. 363-371
-
-
Moran, B.1
Shih, C.F.2
-
24
-
-
0026366856
-
Causes of cracks in SMD and type-specific remedies
-
S. Omi, K. Fujita, T. Tsuda, and T. Maeda Causes of cracks in SMD and type-specific remedies IEEE Transactions on Components Packaging and Manufacturing Technology 14 4 1991 818 823
-
(1991)
IEEE Transactions on Components Packaging and Manufacturing Technology
, vol.14
, Issue.4
, pp. 818-823
-
-
Omi, S.1
Fujita, K.2
Tsuda, T.3
Maeda, T.4
-
25
-
-
0031144424
-
A compact mixed mode (CMM) fracture specimen for adhesive bonded joints
-
H.L.J. Pang, and C.W. Seetoh A compact mixed mode (CMM) fracture specimen for adhesive bonded joints Engineering Fracture Mechanics 57 1997 57 65
-
(1997)
Engineering Fracture Mechanics
, vol.57
, pp. 57-65
-
-
Pang, H.L.J.1
Seetoh, C.W.2
-
26
-
-
0036613760
-
Interfacial fracture toughness test methodology for adhesive bonded joints
-
H.L.J. Pang, X. Zhang, X. Shi, and Z.P. Wang Interfacial fracture toughness test methodology for adhesive bonded joints IEEE Transactions on Components and Packaging Technologies 25 2 2002 187 191
-
(2002)
IEEE Transactions on Components and Packaging Technologies
, vol.25
, Issue.2
, pp. 187-191
-
-
Pang, H.L.J.1
Zhang, X.2
Shi, X.3
Wang, Z.P.4
-
28
-
-
0033344403
-
Influence of temperature, humidity, and defect location on delamination in plastic IC packages
-
A.A.O. Tay, and T.Y. Lin Influence of temperature, humidity, and defect location on delamination in plastic IC packages IEEE Transactions on Components and Packaging Technologies 22 4 1999 512 518
-
(1999)
IEEE Transactions on Components and Packaging Technologies
, vol.22
, Issue.4
, pp. 512-518
-
-
Tay, A.A.O.1
Lin, T.Y.2
-
30
-
-
77956849479
-
Material failure by void growth to coalescence
-
V. Tvergaard Material failure by void growth to coalescence Advances in Applied Mechanics 27 1990 83 151
-
(1990)
Advances in Applied Mechanics
, vol.27
, pp. 83-151
-
-
Tvergaard, V.1
-
33
-
-
58149364799
-
Ductile crack growth-I. A numerical study using computational cells with microstructurally based length scales
-
L. Xia, and C.F. Shih Ductile crack growth-I. A numerical study using computational cells with microstructurally based length scales Journal of the Mechanics and Physics of Solids 43 2 1995 233 259
-
(1995)
Journal of the Mechanics and Physics of Solids
, vol.43
, Issue.2
, pp. 233-259
-
-
Xia, L.1
Shih, C.F.2
|