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Volumn 6, Issue 12, 2003, Pages 24-31
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Electron beam phase-space measurement using a high-precision tomography technique
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 18144424766
PISSN: 10984402
EISSN: 10984402
Source Type: Journal
DOI: 10.1103/PhysRevSTAB.6.122801 Document Type: Article |
Times cited : (40)
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References (11)
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