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Volumn , Issue , 2004, Pages 1430-
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ATE value add through open data collection: Panel position paper for "dude! where's my data? - Cracking open the hermetically sealed tester"
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Author keywords
[No Author keywords available]
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Indexed keywords
ATE VENDORS;
DATA COLLECTION;
SOFTWARE SYSTEMS;
YIELD ENHANCEMENT;
ALGORITHMS;
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
COSTS;
CUSTOMER SATISFACTION;
FIELD PROGRAMMABLE GATE ARRAYS;
INTEGRATED CIRCUIT MANUFACTURE;
RELIABILITY;
DATA REDUCTION;
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EID: 18144416974
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (1)
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References (0)
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