Identifying aspects using fan-in analysis

Proceedings - Working Conference on Reverse Engineering, WCRE

Volumn , Issue , 2004, Pages 132-141

  Marin, Marius ^a   Van Deursen, Arie ^a   Moonen, Leon ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT MINING; ASPECT-ORIENTED PROGRAMMING (AOP); CODE SCATTERING; ERROR HANDLING;

AUTOMATION; DATA MINING; ERROR ANALYSIS; GRAPH THEORY; OBJECT RECOGNITION; PROBLEM SOLVING; REVERSE ENGINEERING;

OBJECT ORIENTED PROGRAMMING;

EID: 18144394348     PISSN: 10951350     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCRE.2004.23     Document Type: Conference Paper

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