Synthesis, structural and microstructural study of Bi4W 0.5Ti0.5O8X (X = Cl, Br) Sillén-Aurivillius intergrowths

Solid State Sciences

Volumn 7, Issue 5, 2005, Pages 486-496

  Ávila Brande, David ^a   Gómez Herrero, Adrián ^a   Landa Cánovas, Ángel R ^b   Otero Díaz, L Carlos ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

Electron microscopy; Layered oxyhalides; Sill n Aurivillius intergrowths; Structural characterisation

Indexed keywords

CRYSTAL GROWTH; ELECTRON DIFFRACTION; MICROSTRUCTURE; MOLECULAR STRUCTURE; SUBSTITUTION REACTIONS; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY;

LAYERED OXYHALIDES; SILLEN-AURIVILLIUS INTERGROWTHS; STRUCTURAL CHARACTERIZATION; STRUCTURAL DEFECTS;

BISMUTH COMPOUNDS;

EID: 18144393852     PISSN: 12932558     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solidstatesciences.2005.01.013     Document Type: Article

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