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Volumn 9, Issue 6, 2003, Pages 1071-1092
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Parameter estimation for the supercritical contact process
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Author keywords
Contact process; Parameter estimation; Random mask; Shrinking; Supercritical
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Indexed keywords
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EID: 18144376420
PISSN: 13507265
EISSN: None
Source Type: Journal
DOI: 10.3150/bj/1072215201 Document Type: Article |
Times cited : (7)
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References (7)
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