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Volumn 47, Issue 4, 2005, Pages 216-219
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Low-coherence interferometry - An advanced technique for optical metrology in industry
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Author keywords
[No Author keywords available]
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Indexed keywords
COATINGS;
COHERENT LIGHT;
COMPOSITION;
FURNACES;
OPTICAL FIBERS;
OPTICAL VARIABLES MEASUREMENT;
POLYMERS;
PROBES;
RHEOMETERS;
SPECTROSCOPY;
SURFACE MEASUREMENT;
WEAR OF MATERIALS;
ELONGATIONAL RHEOMETER;
LASER INDUCED BREAKDOWN SPECTROSCOPY;
LOW COHERENCE INTERFEROMETRY;
OPTICAL PROBE;
WEAR TESTING;
INTERFEROMETRY;
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EID: 18144374160
PISSN: 13542575
EISSN: None
Source Type: Journal
DOI: 10.1784/insi.47.4.216.63149 Document Type: Article |
Times cited : (47)
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References (4)
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