New test paradigms for yield and manufacturability

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 13-

  Madge, Robert ^a  

^a AGERE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT-FREE DIE; DESIGN COMPLEXITY; DESIGN-FOR-MANUFACTURABILITY (DFM); NON-VALUE ADDED;

DECISION MAKING; INTEGRATED CIRCUITS; INVESTMENTS; PARAMETER ESTIMATION; PROCESS CONTROL; STATISTICAL METHODS;

PRODUCT DESIGN;

EID: 18144364021     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)