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Volumn 332, Issue 3, 2001, Pages 223-228
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An adaptation of the multi-scale methods for the analysis of very thin reticulated structures;Une adaptation des méthodes multi-échelles à l'analyse de structures réticulées trés minces
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 18044373200
PISSN: 07644442
EISSN: None
Source Type: Journal
DOI: 10.1016/S0764-4442(00)01794-8 Document Type: Article |
Times cited : (29)
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References (6)
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