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Defect and Diffusion Forum

Volumn , Issue 194-199 PART 1, 2001, Pages 481-486

Diffusion of 44Ti and 63Ni in single-crystal TiAl

(5) Kadowaki, H a,c Ikeda, T a Nakajima, H a Inui, H b Yamaguchi, M b

a OSAKA UNIVERSITY (Japan)

b KYOTO UNIVERSITY (Japan)

c MITSUBISHI HEAVY INDUSTRIES LTD (Japan)

Author keywords

L10 Type Structure; Single Crystal; TiAl; Tracer Diffusion

Indexed keywords

ANISOTROPY; DIFFUSION; LATTICE CONSTANTS; POINT DEFECTS; SINGLE CRYSTALS; VECTORS;

SUBLATTICES;

INTERMETALLICS;

EID: 17944395712 PISSN: 10120386 EISSN: 16629507 Source Type: Journal
DOI: 10.4028/www.scientific.net/ddf.194-199.481 Document Type: Article

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.