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Physical Review A. Atomic, Molecular, and Optical Physics

Volumn 65, Issue 2, 2002, Pages

Fine-structure-resolved measurements of photoelectron angular distributions by single-photon detachment of Sn- at visible wavelengths

(1) Davis, V T a

a UNITED STATES MILITARY ACADEMY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IONS; LASER APPLICATIONS; MATHEMATICAL MODELS; PHOTOELECTRON SPECTROSCOPY; POLARIZATION; TIN; VECTORS;

FINE STRUCTURE RESOLVED MEASUREMENT; PHOTOELECTRON ANGULAR DISTRIBUTION; SINGLE PHOTON DETACHMENT; SPECTRAL DEPENDENCE;

PHOTONS;

EID: 17944387656 PISSN: 10502947 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (9)

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