X-ray absorption near edge structure studies of Fe1-xNixOy thin films

Journal of Electron Spectroscopy and Related Phenomena

Volumn 114-116, Issue , 2001, Pages 545-548

  Chang, C L ^a   Chen, C L ^a   Dong, C L ^a   Chern, G ^b   Lee, J F ^c   Jang, L Y ^c  

^a TAMKANG UNIVERSITY   (Taiwan)

^b NATIONAL CHUNG CHENG UNIVERSITY   (Taiwan)

^c NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ELECTRON ENERGY LEVELS; ELECTRONIC STRUCTURE; FERRITE; FILM GROWTH; IRON OXIDES; MOLECULAR BEAM EPITAXY; OXYGEN; X RAY SPECTROSCOPY;

IRON NICKEL OXIDE; X RAY ABSORPTION NEAR EDGE STRUCTURE (XANES) SPECTROSCOPY;

MAGNETIC THIN FILMS;

EID: 17944385079     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00298-X     Document Type: Article

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