SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 658, Issue , 2001, Pages

Stability and structural characterization of epitaxial NdNiO3 films grown by pulsed laser deposition

(3) Doan, Trong Duc a Abramowski, Cobey a Salvador, Paul A a

a CARNEGIE MELLON UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; EPITAXIAL GROWTH; FILM GROWTH; HIGH TEMPERATURE EFFECTS; LANTHANUM COMPOUNDS; MOLECULAR STRUCTURE; MORPHOLOGY; NEODYMIUM COMPOUNDS; PRESSURE EFFECTS; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; STRONTIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

THIN FILM DEPOSITION;

THIN FILMS;

EID: 17944383994 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.