Thin film Z-scan measurements of the non-linear response of novel conjugated silicon-ethynylene polymers and metal-containing complexes incorporated into polymeric matrices

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4106, Issue 1, 2000, Pages 360-368

  Douglas, W E ^a   Klapshina, L G ^b   Rubinov, A N ^c   Domrachev, G A ^b   Bushuk, B A ^c   Antipov, O L ^d   Semenov, V V ^b   Kuzhelev, A S ^d   Bushuk, S B ^c   Kalvinkovskaya, Ju A ^c  

^a UNIVERSITÉ DE MONTPELLIER   (France)

^b G A RAZUVAEV INSTITUTE OF ORGANOMETALLIC CHEMISTRY   (Russian Federation)

^c B I STEPANOV INSTITUTE OF PHYSICS   (Belarus)

^d INSTITUTE OF APPLIED PHYSICS   (Russian Federation)

Author keywords

Chromium; Cobalt; Neodymium; Polyacrylonitrile; Polymer; Silicon; Sol ge; Third order non linearity; Z scan

Indexed keywords

CHROMIUM; COBALT; FULLERENES; LASER BEAMS; NEODYMIUM; PLASTIC FILMS; POLYACRYLONITRILES; REFRACTIVE INDEX; SILICON; SOL-GELS; SOLID STATE LASERS;

MODE LOCKED LASER; NONLINEAR REFRACTIVE INDEX; POLYACRYLONITRILE FILM; POLYARYLENE ETHYNYLENESILYLENE; THIRD ORDER OPTICAL NONLINEARITY; ULTRASHORT PULSES; Z-SCAN MEASUREMENT;

NONLINEAR OPTICS;

EID: 17944381234     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.408525     Document Type: Article

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