Laser-induced damage behaviors of Ta2O5/SiO2 narrow-band interference filters under different laser output modes

Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams

Volumn 17, Issue 2, 2005, Pages 191-196

  Gao, Wei Dong ^a   He, Hong Bo ^a   Zhao, Yuan An ^a   Shao, Jan Da ^a   Fan, Zheng Xiu ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Free running laser; LIDT; Narrow band interference filters; Single pulse laser

Indexed keywords

ELECTRIC FIELDS; LASER DAMAGE; LIGHT ABSORPTION; MORPHOLOGY; OPTICAL COMMUNICATION; PULSED LASER APPLICATIONS; SILICA; TANTALUM COMPOUNDS;

FREE-RUNNING LASER; LASER INDUCED DAMAGE THRESHOLD; NARROW-BAND INTERFERENCE FILTERS; SINGLE-PULSE LASER;

OPTICAL FILTERS;

EID: 17944379857     PISSN: 10014322     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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