A comparison of the X-ray single-crystal structure of Li3SbO4 with the Rietveld refinement

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 57, Issue 8, 2001, Pages 883-884

  Bernès, Sylvain ^a   Tovar, Sonia Trujillo ^b   Castellanos R, María A ^b  

^a BENEMÉRITA UNIVERSIDAD AUTÓNOMA DE PUEBLA   (Mexico)

^b UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CRYSTAL STRUCTURE; PROBABILITY; SINGLE CRYSTALS; X RAY POWDER DIFFRACTION;

GEOMETRY PARAMETER; RIETVELD REFINEMENT; TRILITHIUM ANTIMONY TETRAOXIDE;

LITHIUM COMPOUNDS;

EID: 17944376460     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270101007569     Document Type: Article

References (7)

1. Blasse, G. (1963). Z. Anorg. Allg. Chem. 326, 44-46.
2. Fait, J. (1991). XSCANS User's Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
3. Glusker, J. P., Lewis, M. & Rossi, M. (1994). Crystal Structure Analysis for Chemists and Biologists, ch. 11. Weinheim: VCH Publishers.
4. Jones, P. G. (1984). Chem. Soc. Rev. 13, 157-172.
5. Sheldrick, G. M. (1995). SHELXTL-Plus. Release 5.03. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
6. Sheldrick, G. M. (1997). SHELXL97. University of Göttingen, Germany.
7. Skakle, J. M. S., Castellanos, M. A., Trujillo Tovar, S., Fray, S. M. & West, A. R. (1996). J. Mater. Chem. 6, 1939-1942.