Electricity characterization of metalloprotein at molecular level by conducting atomic force microscopy

Gaodeng Xuexiao Huaxue Xuebao/Chemical Journal of Chinese Universities

Volumn 26, Issue 4, 2005, Pages 751-753

  Zhao, Jian Wei ^a   Wang, Nan ^b  

^a NANJING UNIVERSITY   (China)

^b CHONGQING UNIVERSITY   (China)

Author keywords

Conducting atomic force microscopy; Dielectric strength; Protein

Indexed keywords

EID: 17944371712     PISSN: 02510790     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)