Ce 5d and Fe 3d magnetic profiles in CeH2/Fe multilayers probed by XRMS

Applied Physics A: Materials Science and Processing

Volumn 73, Issue 6, 2001, Pages 711-715

  Jaouen, N ^a   Tonnerre, J M ^a   Raoux, D ^a   Ortega, L ^a   Bontempi, E ^b   Munzenberg M ^c   Felsch, W ^c   Suzuki, M ^d   Maruyama, H ^e   Durr H A ^f   Dudzik, E ^f   Van Der Laan, G ^f  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^b UNIVERSITY OF BRESCIA   (Italy)

^c UNIVERSITY OF GÖTTINGEN   (Germany)

^d JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^e OKAYAMA UNIVERSITY   (Japan)

^f DARESBURY LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM; CERIUM COMPOUNDS; ELECTRON ENERGY LEVELS; IRON; MAGNETIC VARIABLES MEASUREMENT; MULTILAYERS; POLARIZATION; X RAY SCATTERING;

MAGNETIC CONTRIBUTION; MAGNETIC POLARIZATION; X RAY RESONANT MAGNETIC SCATTERING;

MAGNETIZATION;

EID: 17944368502     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390100966     Document Type: Article

References (16)