Soft x-ray resonant Kerr rotation measurement and simulation of element-resolved and interface-sensitive magnetization reversals in a NiFeFeMnCo trilayer structure

Applied Physics Letters

Volumn 86, Issue 10, 2005, Pages 1-3

  Kim, Sang Koog ^a   Lee, Ki Suk ^a   Kortright, J B ^b   Shin, Sung Chul ^c  

^a Seoul National University   (South Korea)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BLOCKING TEMPERATURE; MAGNETIZATION REVERSALS; ROTATION MEASUREMENT; TRILAYERS;

COMPUTER SIMULATION; FERROMAGNETISM; MAGNETIC ANISOTROPY; MATHEMATICAL MODELS; NIOBIUM COMPOUNDS; OPTICAL KERR EFFECT; SENSITIVITY ANALYSIS; THICKNESS MEASUREMENT; X RAY ANALYSIS;

MAGNETIZATION;

EID: 17944365791     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1873047     Document Type: Article

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