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Volumn 19, Issue 1, 2001, Pages 35-40

XUV interferometry using high-order harmonics: Application to plasma diagnostics

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DENSITY MEASUREMENT; HARMONIC GENERATION; INTERFEROMETRY; REFRACTIVE INDEX; ULTRAVIOLET RADIATION;

EID: 17944361907     PISSN: 02630346     EISSN: None     Source Type: Journal    
DOI: 10.1017/S0263034601191056     Document Type: Conference Paper
Times cited : (9)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.