International comparisons of He-Ne lasers stabilized with 127I2 at λ ≈ 633 nm (July 1997) Part VIII: Comparison of NIM (China), NRLM (Japan), KRISS (Republic of Korea) and BIPM lasers at λ ≈ 633 nm

Metrologia

Volumn 38, Issue 2, 2001, Pages 181-186

  Shen, S ^a   Ni, Y ^a   Qian, J ^a   Liu, Z ^a   Shi, C ^a   An, J ^a   Wang, L ^a   Iwasaki, S ^a   Ishikawa, J ^a   Hong, F L ^a   Suh, H S ^a   Labot, J ^a   Chartier, A ^a   Chartier, J M ^a  

^a NATIONAL INSTITUTE OF METROLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

HELIUM NEON LASERS; SAMPLING; SOCIETIES AND INSTITUTIONS; STANDARDS; STATISTICAL METHODS;

GROUPED LASER COMPARISONS; STABILIZED HELIUM NEON LASERS; STANDARD UNCERTAINTY;

METRIC SYSTEM;

EID: 17844409833     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/38/2/10     Document Type: Article

References (24)