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Volumn 263, Issue 3, 2005, Pages 791-796
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BEAMGAA: A chance for high precision analysis of big samples
c
Retorte Ltd
(Germany)
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Author keywords
[No Author keywords available]
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Indexed keywords
SELENIUM;
ACCURACY;
ARTICLE;
BEAM GEOMETRY ACTIVATION ANALYSIS;
CHEMICAL ANALYSIS;
COMPARATIVE STUDY;
DENSITY;
NEUTRON;
NEUTRON ACTIVATION ANALYSIS;
PHOTON;
PROCESS DEVELOPMENT;
RADIATION DOSE;
RADIATION FIELD;
RADIATION MONITOR;
RADIATION MONITORING;
RADIOCHEMISTRY;
SAMPLE;
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EID: 17844401482
PISSN: 02365731
EISSN: None
Source Type: Journal
DOI: 10.1007/s10967-005-0660-6 Document Type: Article |
Times cited : (6)
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References (3)
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