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Volumn 430, Issue 1-2, 2005, Pages 173-182
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A comparative study on the single-scan and multiple-scan techniques in differential scanning calorimetry: Application to the crystallization of the semiconducting Ge0.13Sb0.23Se0.64 alloy
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Author keywords
Differential scanning calorimetry; Extended volume; Glass crystal transformation; Semiconducting alloy; Single scan and multiple scan techniques
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Indexed keywords
CRYSTALLIZATION;
GERMANIUM ALLOYS;
ISOTHERMS;
MATRIX ALGEBRA;
NUCLEATION;
PHASE TRANSITIONS;
REACTION KINETICS;
SEMICONDUCTOR MATERIALS;
X RAY DIFFRACTION ANALYSIS;
EXTENDED VOLUME;
GLASS-CRYSTAL TRANSFORMATION;
SEMICONDUCTING ALLOYS;
SINGLE-SCAN AND MULTIPLE-SCAN TECHNIQUES;
DIFFERENTIAL SCANNING CALORIMETRY;
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EID: 17844399573
PISSN: 00406031
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tca.2005.01.044 Document Type: Article |
Times cited : (10)
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References (36)
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