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Volumn 430, Issue 1-2, 2005, Pages 173-182

A comparative study on the single-scan and multiple-scan techniques in differential scanning calorimetry: Application to the crystallization of the semiconducting Ge0.13Sb0.23Se0.64 alloy

Author keywords

Differential scanning calorimetry; Extended volume; Glass crystal transformation; Semiconducting alloy; Single scan and multiple scan techniques

Indexed keywords

CRYSTALLIZATION; GERMANIUM ALLOYS; ISOTHERMS; MATRIX ALGEBRA; NUCLEATION; PHASE TRANSITIONS; REACTION KINETICS; SEMICONDUCTOR MATERIALS; X RAY DIFFRACTION ANALYSIS;

EID: 17844399573     PISSN: 00406031     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tca.2005.01.044     Document Type: Article
Times cited : (10)

References (36)
  • 2
    • 0038766236 scopus 로고
    • R.D. Shull A. Joshi The Minerals, Metals and Materials Society Warrendale, PA
    • Z. Altounian, and J.O. Strom-Olsen R.D. Shull A. Joshi Thermal Analysis in Metallurgy 1992 The Minerals, Metals and Materials Society Warrendale, PA 155
    • (1992) Thermal Analysis in Metallurgy , pp. 155
    • Altounian, Z.1    Strom-Olsen, J.O.2
  • 16
    • 0001039566 scopus 로고
    • J.W. Cahn Acta Met. 4 1956 572; J.W. Cahn Acta Met. 4 1956 449
    • (1956) Acta Met. , vol.4 , pp. 572
    • Cahn, J.W.1
  • 17
    • 0001311009 scopus 로고
    • J.W. Cahn Acta Met. 4 1956 572; J.W. Cahn Acta Met. 4 1956 449
    • (1956) Acta Met. , vol.4 , pp. 449
    • Cahn, J.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.