Y-Ba-Cu-O thin films on 3 inch sapphire wafers for microwave devices

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 357-360

  Aidam, R ^a   Geerk, J ^a   Linker, G ^a   Ratzel, F ^a   Reiner, J ^a   Schneider, R ^a   Smithey, R ^a   Zaitsev, A G ^a   Gaganidze, E ^a   Schwab, R ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

Microwave measurement technique; Superconducting devices; Surface resistance; YBCO films

Indexed keywords

CERIUM COMPOUNDS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELECTRIC RESISTANCE; EPITAXIAL GROWTH; ETCHING; MICROWAVE DEVICES; OXIDE SUPERCONDUCTORS; PHOTOLITHOGRAPHY; RESONATORS; SAPPHIRE; SPUTTER DEPOSITION; YTTRIUM BARIUM COPPER OXIDES;

MICROSTRIP RESONATORS; SAPPHIRE WAFER; SURFACE RESISTANCE; WET ETCHING;

SUPERCONDUCTING FILMS;

EID: 17844391530     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919356     Document Type: Conference Paper

References (11)

1. Increased quality factor in superconducting microstrip resonators by selective removal of the gold contact layer
2. High temperature superconductor thin films at microwave frequencies