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Volumn 178, Issue 3, 2005, Pages 715-728
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Ba6Ge25: Low-temperature Ge-Ge bond breaking during temperature-induced structure transformation
a
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Author keywords
Ba6Ge25; Binary Ba Ge system; Dangling bonds; Ge Ge bond breaking; Lone pairs; Phase transition; Reconstructive transformation; Split sites
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Indexed keywords
BARIUM;
CHARGE CARRIERS;
CHEMICAL BONDS;
DIFFERENTIAL THERMAL ANALYSIS;
GERMANIUM;
PHASE TRANSITIONS;
POLYCRYSTALLINE MATERIALS;
REACTION KINETICS;
SINGLE CRYSTALS;
X RAY DIFFRACTION;
BA6GE25;
BINARY BA-GE SYSTEM;
DANGLING BONDS;
GE-GE BOND BREAKING;
LONE-PAIRS;
RECONSTRUCTIVE TRANSFORMATION;
SPLIT SITES;
BARIUM COMPOUNDS;
BARIUM DERIVATIVE;
CRYSTALLIN;
GERMANIUM DERIVATIVE;
ARTICLE;
AUTOMETALLOGRAPHY;
BIOLISTIC TRANSFORMATION;
CHEMICAL BOND;
COOLING;
CRYSTAL STRUCTURE;
DEGRADATION KINETICS;
DIFFERENTIAL SCANNING CALORIMETRY;
ELECTRICITY;
ELECTRON TRANSPORT;
HYSTERESIS;
MOLECULAR DYNAMICS;
MOLECULAR INTERACTION;
PARAMETER;
PHASE TRANSITION;
REACTION ANALYSIS;
REACTION OPTIMIZATION;
SOLID STATE;
STATISTICAL SIGNIFICANCE;
STRUCTURE ANALYSIS;
THERMODYNAMICS;
X RAY POWDER DIFFRACTION;
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EID: 17844372489
PISSN: 00224596
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jssc.2004.11.011 Document Type: Article |
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Times cited : (63)
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References (25)
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