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Volumn 164-165, Issue , 2005, Pages 1430-1435

Modeling of manufacturing processes by learning systems: The naïve Bayesian classifier versus artificial neural networks

Author keywords

Artificial neural networks; Learning systems; Manufacturing process; Modeling; Na ve Bayesian classifier

Indexed keywords

COMPUTER SIMULATION; ERROR DETECTION; MANUFACTURE; MATHEMATICAL MODELS; NEURAL NETWORKS; PARAMETER ESTIMATION; REGRESSION ANALYSIS; TOPOLOGY; INDUSTRIAL ENGINEERING; MODELS; PRODUCTION ENGINEERING;

EID: 17844369454     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmatprotec.2005.02.043     Document Type: Article
Times cited : (23)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.