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Volumn 164-165, Issue , 2005, Pages 1430-1435
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Modeling of manufacturing processes by learning systems: The naïve Bayesian classifier versus artificial neural networks
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Author keywords
Artificial neural networks; Learning systems; Manufacturing process; Modeling; Na ve Bayesian classifier
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Indexed keywords
COMPUTER SIMULATION;
ERROR DETECTION;
MANUFACTURE;
MATHEMATICAL MODELS;
NEURAL NETWORKS;
PARAMETER ESTIMATION;
REGRESSION ANALYSIS;
TOPOLOGY;
INDUSTRIAL ENGINEERING;
MODELS;
PRODUCTION ENGINEERING;
MANUFACTURING PROCESS;
MATHEMATICAL TOOLS;
MODELING;
NÄIVE BAYESIAN CLASSIFIER;
LEARNING SYSTEMS;
BAYESIAN CLASSIFIER;
IMPORTANCE FACTORS;
INDUSTRIAL DATUM;
MANUFACTURING PROCESS;
MODELING CAPABILITIES;
PREDICTION ERRORS;
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EID: 17844369454
PISSN: 09240136
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jmatprotec.2005.02.043 Document Type: Article |
Times cited : (23)
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References (7)
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